News

The SHSCam HR4-130-GE-DUV offers highest sensitivity at 193nnm
The new modular test platform for testing contact lenses - measurement of power map, lens diameter and wavefront in <1 second.

Events

EFCLIN
EFCLIN
24. - 26.04.2025
-Lilleström / Oslo-

51st Annual EFCLIN Congress and Exhibition


Know your quality! Best in class contact lens metrology.


Take the chance to experience our lens testing systems and to and discuss your application with our experts on site.
SPIE Photonics West
SPIE Photonics West
28. - 30.01.2025
-San Francisco-

Hall C, Booth # 2166

Know your quality! Industrial metrology for testing of optics and lasers.

In San Francisco we showcase our solutions for measurement of wavefronts, distance and displacement.
Take this opportunity to see our latest wavefront metrology and to and discuss your application directly with us.

And don't miss our talk at the Optical Sensing and Precision Metrology Conference.