Measurement of the optical quality of lens assemblies for photography and movie
Whether telephoto, macro or wide-angle lens: a sound design, precise manufacturing and careful testing are prerequisites for high contrast and optimal imaging performance.Wavefront measurement technology allows assessment of the imaging properties of a lens assembly to be accurately determined using the transmitted wavefront. Accuracies of lambda/20 PVr are achieved. The measured wavefront data can then be compared with the design as early as sample production. Optocrafts automated lens testing stations measure wave aberrations on axis and in the field, and can provide inormation on chromatic or polarization effects.
Compared to classic MTF measurements, knowledge of the wavefront and the corresponding Zernike decompposition facilitates the identification of possible causes of errors, and provides considerably better options for comparison with simulation data. Due to the high intrinsic stability and evaluation speed, wavefront measurement technology is suitable for inline inspection and monitoring of the manufacturing process and is also used for active adjustment.Inspection of filters and plano optics
Polarizing filters, gray filters and colour filters also contribute to the optical performance of the overall optical system, and must have a sufficiently sound transmitted wavefront. The extremely simple referencing of the inspection system with a blank measurement allows flat optics to be measured both easily and precisely.
Since the test wavelength can be set flexibly with the SHSInspect systems, the inspection of colour filters with different characteristics is possible without additional effort. Gray filters with optical densities up to OD 8 can also be measured in a single pass.
Our solution for the measurement of lens imaging quality
Systems and modules of the SHSInspect family measure the transmitted wavefront, PSF and MTF. Moreover, they provide information on colour aberrations, focal length and polarization effects, and enable measurements at field points.
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